Preparation and characterization of bismuth nanostructures deposited by pulsed laser ablation

7th International Congress of Engineering Physics

物理学;工业技术

Escobar-Alarcón, L.^1 ; Morales-Mendez, J.G.^2 ; Solís-Casados, D.A.^3 ; Romero, S.^1 ; Fernández, M.^1 ; Haro-Poniatowski, E.^2

Departamento de Física, Instituto Nacional de Investigaciones Nucleares, Apdo. Postal 18-1027, México DF

11801, Mexico^1

Departamento de Física, Universidad Autónoma Metropolitana Iztapalapa, Apdo. Postal 55-534, México, D.F., Mexico^2

Centro Conjunto de Investigación en Química Sustentable UAEM-UNAM, Carretera Toluca-Atlacomulco Km 14.5, Unidad San Cayetano, México, Toluca

50200, Mexico^3

关键词: Bi films;    Dendritic structures;    Deposited materials;    Different substrates;    Individual particles;    Morphology and size;    ND : YAG lasers;    Physical and chemical properties;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/582/1/012013/pdf
DOI  :  10.1088/1742-6596/582/1/012013

学科分类：工业工程学

来源: IOP

【 摘 要 】

Bismuth nanostructures, from nanoparticles to quasi-percolated films, were deposited by pulsed laser ablation (PLA) on different substrates using the 355 nm line of a Nd:YAG laser. The morphology and size distribution of the obtained nanostructures were investigated, as a function of the number of ablation pulses, by high resolution electron microscopy (HRTEM) and atomic force microscopy (AFM). Deposits with a small number of pulses, 50, are formed of separated isolated particles with diameters in the range from 5 to 20 nm. Further increase in the number of pulses (>100) results in coalescence of individual particles with the formation of dendritic structures and finally, for 500 pulses, quasi-percolated Bi films are obtained. Additionally, the nanostructures formed were characterized by XPS, and Raman spectroscopy in order to determine the physical and chemical properties of the deposited material.