Preparation of nanostructured Bi-modified TiO2 thin films by crossed-beam laser ablation plasmas

8th International Congress of Engineering Physics

物理学;工业技术

Escobar-Alarcon, L.^1 ; Solís-Casados, D.A.^2 ; González-Zavala, F.^2 ; Romero, S.^1 ; Fernandez, M.^3 ; Haro-Poniatowski, E.^4

Departamento de Física, Instituto Nacional de Investigaciones Nucleares, Apdo. Postal 18-1027, México DF

11801, Mexico^1

Centro Conjunto de Investigación en Química Sustentable UAEM-UNAM, Estado de México, Carretera Toluca-Atlacomulco Km 14.5, Toluca

50200, Mexico^2

Departamento de Aceleradores, Instituto Nacional de Investigaciones Nucleares, Apdo. Postal 18-1027, México DF

11801, Mexico^3

Departamento de Física, Universidad Autónoma Metropolitana Iztapalapa, Apdo. Postal 55-534, México, D.F., Mexico^4

关键词: Deposited films;    Deposited materials;    Elemental compositions;    Laser ablation plasmas;    Nano-structured;    Structural modifications;    Titanium dioxide thin film;    UV-vis spectroscopy;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/792/1/012006/pdf
DOI  :  10.1088/1742-6596/792/1/012006

学科分类：工业工程学

来源: IOP

【 摘 要 】

The preparation and characterization of titanium dioxide thin films modified with different amounts of bismuth using a two laser ablation plasmas configuration is reported. The plasmas were produced ablating simultaneously two different targets, one of bismuth and other of titanium dioxide, using a Nd:YAG laser with emission in the fundamental line. The elemental composition, together with the vibrational and optical properties of the deposited films were investigated as a function of the parameters of the bismuth plasma. The composition of the thin films was determined from measurements of X-ray photoelectron spectroscopy (XPS) as well as by Rutherford backscattering spectroscopy (RBS). The structural modification of the deposited material, due to the incorporation of Bi, was characterized by Raman spectroscopy. The optical properties were determined from UV-Vis spectroscopy measurements. It is found that bismuth incorporation has an important effect on the optical properties of TiO2narrowing the band gap from 3.2 to 2.5 eV.