On the bad metallicity and phase diagrams of Fe1+δX (X =Te, Se, S, solid solutions): an electrical resistivity study

27th International Conference on Low Temperature Physics

El Massalami, M.E.^1 ; Deguchi, K.^2 ; Machida, T.^3 ; Takeya, H.^2 ; Takano, Y.^2

Instituto de Física, Universidade Federal Do Rio de Janeiro, Caixa Postal 68528, Rio de Janeiro RJ

21941-972, Brazil^1

National Institute for Materials Science, 1-2-1 Sengen, Tsukuba

305-0047, Japan^2

Department of Physics, Tokyo University of Science, 1-3 Kagurazaka, Shinjuku-ku, Tokyo

162-8601, Japan^3

关键词: Crossover events;    High temperature;    Low temperatures;    Superconducting transitions;    Systematic analysis;    Thermal evolution;    Thermally activated;    Thermally activated process;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/568/2/022012/pdf
DOI  :  10.1088/1742-6596/568/2/022012

来源: IOP

【 摘 要 】

Based on a systematic analysis of The thermal evolution of The resistivities of Fe-based chalcogenides Fe1+δTe1-xXx(X Se, S), it is inferred that their often observed nonmetallic resistivities are related to a presence of two resistive channels: one is a high- temperature thermally-activated process while The other is a low-temperature log-in-T process. On lowering temperature, there are often two metal-to-nonmetall crossover events: one from The high-T thermally-activated nonmetallic regime into a metal-like phase and The other from The log-in-T regime into a second metal-like phase. Based on these events, together with The magnetic and superconducting transitions, a phase diagram is constructed for each series. We discuss The origin of both processes as well as The associated crossover events. We also discuss how these resistive processes are being influenced by pressure, intercalation, disorder, doping, or sample condition and, in turn, how these modifications are shaping The associated phase diagrams.