Field emission properties of aligned ZnO nanorods on Ti substrate

Electron Microscopy and Analysis Group Conference 2013

Algarni, H.^1,2 ; El-Gomati, M.M.^1 ; Al-Assiri, M.S.^3,4

Department of Electronics, University of York, York, United Kingdom^1

Department of Physics, Faculty of Science, King Khalid University, PO Box 9003, Abha, Saudi Arabia^2

Promising Center for Sensors and Electronic Devices (PCSED), Najran University, PO Box 1988, Najran 11001, Saudi Arabia^3

Faculty of Sciences and Arts, Department of Physics, Najran University, P.O. 1988, Najran-11001, Saudi Arabia^4

关键词: Aligned ZnO nanorods;    Analytical tool;    Field emission devices;    Field emission property;    Field emission scanning electron microscopy;    Thermal evaporation process;    Ti substrates;    Turn-on field;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/522/1/012075/pdf
DOI  :  10.1088/1742-6596/522/1/012075

来源: IOP

【 摘 要 】

Aligned ZnO nanorods were grown on titanium (Ti) substrate by simple and facile thermal evaporation process using high purity metallic zinc powder in the presence of oxygen. The grown nanorods were studied in terms of their morphological, structural and field emission properties by using different analytical tools such as field emission scanning electron microscopy (FESEM) and X-ray diffraction (XRD). The field emission properties of the as-grown aligned ZnO nanorods were also investigated which resulted in a turn-on field of ∼2.65 kV. This research demonstrates that simply prepared ZnO nanorods can be used for field emission device applications.