HTS ion damage Josephson junction technology for SQUID arrays

11th European Conference on Applied Superconductivity

Ouanani, S.^1 ; Kermorvant, J.^2 ; Crété, D.-G.^1 ; Lemaître, Y.^1 ; Mage, J.-C.^1 ; Marcilhac, B.^1 ; Bergeal, N.^3 ; Malnou, M.^3 ; Lesueur, J.^3 ; Mailly, D.^4 ; Ulysse, C.^4

Unite Mixte de Physique CNRS/Thales and Universite Paris-Sud, 1 Av. A Fresnel, Palaiseau

FR-91767, France^1

THALES Communication and Security, 4 Av. des Louvresses, Gennevilliers cedex

92622, France^2

LPEM / ESPCI-CNRS-UPMC, 10 Rue Vauquelin, Paris

FR-75005, France^3

Laboratoire de Photonique et de Nanostructures, Route de Nozay, Marcoussis

FR-91460, France^4

关键词: Barrier thickness;    High temperature superconducting;    Ion damage;    Josephson-junction;    Magnetic field sensitivity;    SQUID array;    Superconducting quantum interference filters;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/507/4/042008/pdf
DOI  :  10.1088/1742-6596/507/4/042008

来源: IOP

【 摘 要 】

The high temperature superconducting (HTS) Josephson Junction (JJ) ion damage technology we are developing is well suited for making large SQUID arrays. We have studied arrays of similar SQUIDs together with large SQIFs (Superconducting Quantum Interference Filter) with 2000 SQUIDs of different loop areas. Magnetic field sensitivity has been measured in both types of devices as a function of bias current and temperature. The effects of the barrier thickness (from 20 to 80 nm) and JJ length (2 or 5 μm) on characteristics have been investigated.