会议论文详细信息
11th European Conference on Applied Superconductivity | |
The dependence of resistively measured Bc2 and Birr on BaZrO3 concentration in YBa2Cu3O6+x thin films | |
Malmivirta, M.^1 ; Palonen, H.^1,2 ; Huhtinen, H.^1 ; Paturi, P.^1 | |
Wihuri Physical Laboratory, Department of Physics and Astronomy, University of Turku, Turku | |
FI-20014, Finland^1 | |
National Doctoral Programme in Nanoscience (NGS-NANO), Turku, Finland^2 | |
关键词: Angular dependence; In-field; Out-of plane; Resistive measurements; Scaling parameter; YBa2Cu3O6+x; | |
Others : https://iopscience.iop.org/article/10.1088/1742-6596/507/1/012030/pdf DOI : 10.1088/1742-6596/507/1/012030 |
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来源: IOP | |
【 摘 要 】
The effect of BaZrO3(BZO) concentration on Birrand Bc2in YBa2Cu3O6+x(YBCO) thin films was investigated with resistive measurements. It was found that in field out-of-plane configuration both Birrand Bc2decrease with the highest BZO concentration of 9 wt% whereas the other samples show no significant change. The angular dependence of Birrof the highest BZO concentration sample has a pronounced c-axis peak that is typical for BZO-doped YBCO but the others do not exhibit that clear peak. On the other hand, Bc2obeys the Blatter scaling law and the Blatter scaling parameter γ levels off to 3 - 3.5 above few wt% of BZO.
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