Structural studies of thin Pd films loaded with hydrogen

13th International Workshop on Slow Positron Beam Techniques and Applications

Melikhova, O.^1 ; Cízek, J.^1 ; Vlcek, M.^1 ; Luká, F.^1 ; Procházka, I.^1 ; Anwand, W.^2 ; Brauer, G.^2

Charles University in Prague, Faculty of Mathematics and Physics, V Holeovikách 2, 180 00 Prague 8, Czech Republic^1

Institut für Strahlenphysik, Helmholtz-Zentrum Dresden-Rossendorf, Postfach 510119, D-01314 Dresden, Germany^2

关键词: Critical hydrogen concentration;    Induced defects;    Nanocrystallines;    Pd film;    Polycrystalline;    Polycrystalline film;    Structural studies;    Variable-energy positron annihilation spectroscopies;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/505/1/012015/pdf
DOI  :  10.1088/1742-6596/505/1/012015

来源: IOP

【 摘 要 】

In this work variable energy positron annihilation spectroscopy was employed for investigation of defects created in Pd films electrochemically charged with hydrogen. The development of hydrogen-induced defects in nanocrystalline, polycrystalline and epitaxial Pd films were compared. It was found that absorbed hydrogen causes plastic deformation and increases defect density in all Pd films studied. Moreover, buckling was observed in nanocrystalline and polycrystalline films loaded above certain critical hydrogen concentration.