Development of surface sensitive DXAFS measurement method by applying Kramers-Kronig relations to total reflection spectra

1st Conference on Light and Particle Beams in Materials Science 2013

物理学;材料科学

Abe, Hitoshi^1 ; Niwa, Yasuhiro^1 ; Nitani, Hiroaki^1 ; Nomura, Masaharu^1

Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan^1

关键词: Fourier;    Kramers-Kronig analysis;    Measurement methods;    Peak position;    Si substrates;    Time resolution;    Total reflection;    Total reflection xafs;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/502/1/012035/pdf
DOI  :  10.1088/1742-6596/502/1/012035

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

Total reflection XAFS spectra are obtained combining with dispersive XAFS (DXAFS) configuration. A total reflection DXAFS spectrum of 30 nm Co layer on Si substrate was measured in 4 ms. Kramers-Kronig analysis was applied to extract XAFS signal from total reflection spectra. Spectra obtained by this method are comparable to usual XAFS spectra in terms of signal-to-noise ratios and peak positions in Fourier transformed EXAFS functions. The development of this Kramers-Kronig relations based DXAFS method is useful to study the variation of the surface state with the time resolution of millisecond.