Development of technique for three-dimensional visualization of grain boundaries by white X-ray microbeam

1st Conference on Light and Particle Beams in Materials Science 2013

物理学;材料科学

Kajiwara, K.^1 ; Shobu, T.^2 ; Toyokawa, H.^1 ; Sato, M.^1

Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198, Japan^1

Japan Atomic Energy Agency, Sayo, Hyogo 679-5148, Japan^2

关键词: Micro beams;    Plastic tube;    Silicon single crystals;    SPring-8;    Three dimensional images;    Three dimensional visualization;    White X-ray;    X-ray computed tomography;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/502/1/012020/pdf
DOI  :  10.1088/1742-6596/502/1/012020

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

A technique for three-dimensional visualization of grain boundaries was developed at BL28B2 at SPring-8. The technique uses white X-ray microbeam diffraction and a rotating slit. Three-dimensional images of small silicon single crystals filled in a plastic tube were successfully obtained using this technique for demonstration purposes. The images were consistent with those obtained by X-ray computed tomography.