会议论文详细信息
18th APS-SCCM; 24th AIRAPT
Effects observed when using metallic flyers and barriers with the embedded particle velocity gauge technique
Goff, M.^1,2 ; Burns, M.^2 ; Gustavsen, R.^3 ; Stennett, C.^1 ; Hazell, P.J.^4 ; Appleby-Thomas, G.J.^1
Cranfield University, Shrivenham, Swindon, SN6 8LA, United Kingdom^1
AWE, Aldermaston, Reading
RG7 4PR, United Kingdom^2
Los Alamos National Laboratory, Mail Stop P952, Los Alamos
NM
87545, United States^3
School of Engineering and Information Technology, UNSW Canberra, University of New South Wales, Northcott Drive, Canberra
ACT
2600, Australia^4
关键词: Correction method;    Embedded particles;    High-fidelity;    Metallic elements;    Particle velocities;    Perturbation effect;    Post processing;    Signal strengths;   
Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/500/14/142017/pdf
DOI  :  10.1088/1742-6596/500/14/142017
来源: IOP
PDF
【 摘 要 】

A number of experiments were carried out using a modified version of the standard particle velocity gauge technique in plate impact experiments with inert targets. Unusually these utilised dynamic metallic elements. Traditional methodology advises against the use of metallic flyers/barriers with this technique as conductive objects moving in the magnetic field produce perturbations in the output gauge voltage leading to inaccuracies in the derived particle velocities. This body of work investigated the causes of the perturbation effect, methods of minimising its magnitude and possible post-processing correction methods. In experiments with Al flyers, perturbations on the order of 10-15% of signal strength were observed. While the magnitude of the voltage traces were distorted, key features such as shock impact could still be observed, and shock tracker gauges were still effective. The case of metallic barriers was also examined and similar effects observed. This study has indicated that while a coarse empirical correction is possible, uncertainty in the validity of the correction would preclude the use of dynamic metallic elements in experiments where high fidelity data is required.

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