Electron-impact ionization of 4d-shell xenon and tin ions

28th International Conference on Photonic, Electronic and Atomic Collisions

Borovik, A.^1 ; Gharaibeh, M.F.^2 ; Rausch, J.^1 ; Rudolph, J.^1 ; Hillenbrand, P.M.^1 ; Schippers, S.^1 ; Müller, A.^1

Institut für Atom- und Molekülphysik, Justus-Liebig Universität, Giessen

35392, Germany^1

Physics Department, Jordan University of Science and Technology, Irbid

22110, Jordan^2

关键词: Charge state;    Distorted waves;    Electron impact;    Electron impact-ionization;    Ionization process;    Single ionization;    Tin ions;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/488/6/062025/pdf
DOI  :  10.1088/1742-6596/488/6/062025

来源: IOP

【 摘 要 】

Electron-impact single ionization of xenon and tin ions for charge states where the 4d-subshell is the outermost has been investigated. Measured cross sections have been analyzed in detail by comparing with configuration-averaged distorted wave (CAWD) calculations. Contributions of different direct- and indirect ionization processes have thus been quantitatively revealed.