An ion current intensity measurement device in visible light emission measurements of the interaction of slow, highly charged ion with solid surfaces

28th International Conference on Photonic, Electronic and Atomic Collisions

Zhao, Hong-Yun^1,2 ; Su, Hong^1 ; Xu, Qiu-Mei^1 ; Guo, Yi-Pan^1,2 ; Kong, Jie^1 ; Qian, Yi^1 ; Yang, Zhi-Hu^1

Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, Gansu

730000, China^1

University of Chinese Academy of Sciences, Beijing

100049, China^2

关键词: Current intensity;    Highly charged ions;    Ion currents;    Real time;    Solid surface;    Visible light emission;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/488/14/142012/pdf
DOI  :  10.1088/1742-6596/488/14/142012

来源: IOP

【 摘 要 】

In order to solve the problem of influence on measured spectrum caused by the ion current with unstable current intensity, we developed a set of device which can acquire and save the data of ion current intensities in real time during experiment. By means of off-line normalizing th saved data by PC, the influence will be eliminated efficiently.