Electron capture at low velocity in the collision of Ar17+ ions with atoms, clusters and solids

28th International Conference on Photonic, Electronic and Atomic Collisions

Prigent, C.^1 ; Lamour, E.^1 ; Rozet, J.-P.^1 ; Steydli, S.^1 ; Trassinelli, M.^1 ; Vernhet, D.^1

Institut des Nanosciences de Paris, CNRS- UMR7588, Université Pierre et Marie Curie, Paris, France^1

关键词: Charge state distribution;    Electron capture;    Gaseous targets;    High resolution;    Ion-atom interactions;    Slow highly charged ions;    Supersonic jets;    X-ray techniques;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/488/1/012029/pdf
DOI  :  10.1088/1742-6596/488/1/012029

来源: IOP

【 摘 要 】

Absolute x-ray emission has been measured when Ar17+ions at 255 keV collide either with atomic gaseous targets of Ar or N2, with Ar clusters or with thin carbon foils. Preliminary results show a strong decrease of the x-ray signal with the backing pressure of the cluster supersonic jet compared to ion-atom interaction. This effect is a clear signature of slow highly charged ions interacting with clusters. Additionally, high resolution x-ray technique gives us access to the charge state distribution of the emitting ions.