Novel Algorithm for Sample Material Parameter Determination using THz Time-Domain Spectrometer Signal Processing

2nd Russia-Japan-USA Symposium on the Fundamental and Applied Problems of Terahertz Devices and Technologies

Zaytsev, Kirill I.^1 ; Gavdush, Arseniy A.^1 ; Lebedev, Sergey P.^2 ; Yurchenko, Stanislav O.^1

Bauman Moscow State Technical University, 2nd Baumanskaya str., 5, Moscow, 105005, Russia^1

A. M. Prokhorov General Physics Institute, Russian Academy of Sciences, Russia^2

关键词: Algorithm implementation;    Backward wave oscillator;    Error function;    Material parameter;    Novel algorithm;    Pulsed spectrometer;    Theoretical modeling;    Time domain spectrometers;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/486/1/012018/pdf
DOI  :  10.1088/1742-6596/486/1/012018

来源: IOP

【 摘 要 】

In our research we have developed a novel sample material parameter determination algorithm which could be used for characterization of very thin flats. Utilizing this algorithm one could find optical properties of the media which are thin enough to cause appearance of the satellite pulses in TDS system signal, transmitted through the flat sample. The algorithm is based on the minimization of the Error function (minimization between the theoretical model of sample transfer function and the experimental data collected with THz pulsed spectrometer). The algorithm was implemented experimentally and tested by means of the test samples characterization. The results of the algorithm implementation were compared with the results of the same test sample studying using terahertz backward-wave oscillator spectroscopy.