2nd Russia-Japan-USA Symposium on the Fundamental and Applied Problems of Terahertz Devices and Technologies | |
Novel technique for medium permittivity profile reconstruction using THz pulsed spectroscopy | |
Zaytsev, Kirill I.^1 ; Chernomyrdin, Nikita V.^1 ; Alekhnovich, Valentin I.^1 | |
Bauman Moscow State Technical University, 2nd Baumanskaya Str., 5, Moscow, 105005, Russia^1 | |
关键词: Additive Gaussian white noise; Dielectric permittivities; Embedding technique; Finite difference time domain technique; Low and high frequencies; Permittivity profiles; Terahertz time domain spectroscopy; Time domain reflections; | |
Others : https://iopscience.iop.org/article/10.1088/1742-6596/486/1/012010/pdf DOI : 10.1088/1742-6596/486/1/012010 |
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来源: IOP | |
【 摘 要 】
A new method for permittivity profile reconstruction based on terahertz time-domain spectroscopy signal processing is presented. Reconstruction is accomplished in two steps. First, the sample pulse function is reconstructed using sample time-domain reflection data. Low and high frequency noise filtering and the interpolation of the pulse function at low frequencies are then applied. Second, an invariant embedding technique is used to calculate the dielectric permittivity profile based on the sample pulse function. Method was tested experimentally on samples with known permittivity profiles. The algorithm is stable to additive Gaussian white noise as shown using mathematical modeling based on the finite-difference time-domain technique (FDTD). Possible applications of this permittivity profile reconstruction technique are discussed.
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