Cross-sectional TEM preparation of hybrid inorganic/organic materials systems by ultramicrotomy

18th Microscopy of Semiconducting Materials Conference

物理学;材料科学

Kirmse, H.^1 ; Oehlschlegel, E.^1 ; Polzer, F.^1 ; Blumstengel, S.^2 ; Sparenberg, M.^2 ; Henneberger, F.^2

Humboldt-Universität zu Berlin, Institut für Physik, AG TEM, Newtonstraße 15, 12489 Berlin, Germany^1

Humboldt-Universität zu Berlin, Institut für Physik, AG Photonik, Newtonstraße 15, 12489 Berlin, Germany^2

关键词: Cross-sectional TEM;    Heat sensitivity;    High-resolution TEM;    Hybrid inorganic-organic;    Interfacial structures;    Materials systems;    Sectional views;    Ultra-microtomy;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/471/1/012034/pdf
DOI  :  10.1088/1742-6596/471/1/012034

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

Preparation of hybrid inorganic-organic systems (HIOS) for transmission electron microscopy (TEM) in cross sectional view is the key for understanding the interfacial structure. Strikingly different materials properties like hardness, cleavability and heat sensitivity limit the number of applicable preparation strategies. Successful preparation of a HIOS system combining ZnO and para-sexiphenyl (6P) is realized by ultramicrotomy. It is shown that the alignment of the cutting plane with respect to the (0001) cleavage plane of ZnO plays a decisive role for successful preparation of extended TEM lamellae and the preservation of the HIOS structure. In particular, for (0001) oriented ZnO substrates the optimum cut direction is parallel to the HIOS interface. In cross-sectional high-resolution TEM images (100) lattice planes of 6P are observed proving the appropriate preparation strategy.