Multi-contrast computed laminography at ANKA light source

11th International Conference on X-ray Microscopy

Cheng, Y.^1,2 ; Altapova, V.^3 ; Helfen, L.^1,4 ; Xu, F.^1 ; Dos Santos Rolo, T.^1 ; Vagovi, P.^1 ; Fiederle, M.^2 ; Baumbach, T.^1,3

Institute for Photon Science and Synchrotron Radiation, ANKA Light Source, Karlsruhe Institute of Technology (KIT), D-76344 Karlsruhe, Germany^1

Freiburger Materialforschungszentrum (FMF), University of Freiburg, D-79104 Freiburg, Germany^2

Laboratory for Applications of Synchrotron Radiation (LAS), Karlsruhe Institute of Technology (KIT), Postfach 6980, D-76128 Karlsruhe, Germany^3

European Synchrotron Radiation Facility (ESRF), F-38043 Grenoble, France^4

关键词: Computed laminography;    Extended objects;    High resolution detector;    Instrumentation designs;    Non-destructive imaging;    Parallel beam geometry;    Synchrotron source;    Three-dimensional microscopy;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/463/1/012038/pdf
DOI  :  10.1088/1742-6596/463/1/012038

来源: IOP

【 摘 要 】

X-ray computed laminography has been developed as a non-destructive imaging technique for inspecting laterally extended objects. Benefiting from a parallel-beam geometry, high photon flux of synchrotron sources and modern high-resolution detector systems, synchrotron radiation computed laminography (SRCL) results in a powerful three-dimensional microscopy technique. SRCL can be combined with different contrast modes, such as absorption, phase and dark-field contrasts, in order to provide complementary information for the same specimen. Here we show the development of SRCL at the TopoTomo beamline of the ANKA light source. A novel instrumentation design is reported and compared to the existing one. For this design, experimental results from different contrast modalities are shown.