Mathematical models of extended objects used for planning submeter resolution satellite imagery

International Workshop "Advanced Technologies in Material Science, Mechanical and Automation Engineering – MIP: Engineering – 2019"

材料科学;机械制造;原子能学

Mozgovoy, D.K.^1 ; Svinarenko, D.N.^1 ; Kapustina, S.V.^2 ; Tsarev, R.Y.^2 ; Yamskikh, T.N.^2 ; Kartsan, I.N.^3 ; Saleh, Ahmad M.^4

Oles Honchar Dnipropetrovsk National University, Gagarin Prospect, 72, Dnipropetrovsk

49000, Ukraine^1

Siberian Federal University, Svobodny pr., 79, Krasnoyarsk

660041, Russia^2

Reshetnev Siberian State University of Science and Technology, Krasnoyarsky Rabochy Ave., 31, Krasnoyarsk

660037, Russia^3

Prince Sattam Bin Abdulaziz University, Alkharj, Riyadh, Saudi Arabia^4

关键词: Complex configuration;    Extended objects;    Imaging instruments;    Mathematical descriptions;    Maximum coverage;    Optoelectronic scanners;    Spatial resolution;    Spline approximations;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/537/5/052037/pdf
DOI  :  10.1088/1757-899X/537/5/052037

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

This paper presents mathematical models describing extended objects with complex configuration used for planning satellite imagery with optoelectronic scanners of submeter spatial resolution. The most efficient spline approximation methods were used for mathematical description of extended objects with complex configuration. The proposed method ensures obtaining maximum coverage of the extended object in one-orbit period by choosing an appropriate spline smoothing coefficient, shifting and turning coverage contour. The results of computer simulation of extended object imagery are given, taking into account the swath width of the imaging instrument, the required scanning direction and limitations on retargeting angles range and satellite angular velocities.