| 11th International Conference on X-ray Microscopy | |
| Hard X-ray Nanoprobe with Spherical-aberration-corrected Quad-spherical-mirror Optics | |
| Suzuki, Yoshio^1 ; Takeuchi, Akihisa^1 | |
| JASRI/Spring-8, Koto 1-1-1 Sayo, Hyogo 679-5198, Japan^1 | |
| 关键词: Focusing properties; Grazing incidence; Grazing incidence optics; Kirkpatrick-Baez; Scanning x-ray microscopy; Spherical aberrations; Spherical concaves; Total reflection mirrors; | |
| Others : https://iopscience.iop.org/article/10.1088/1742-6596/463/1/012019/pdf DOI : 10.1088/1742-6596/463/1/012019 |
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| 来源: IOP | |
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【 摘 要 】
A quad-mirror system is developed for nanofocusing of hard x-ray beam. The optical system consists of four spherical-concave total-reflection mirrors. Each two mirrors are combined in a tandem-mirror configuration to compensate spherical aberrations in grazing-incidence mirror optics, and a pair of the tandem-spherical mirrors is configured in a crossed mirror system (Kirkpatrick-Baez optics) to eliminate astigmatism in grazing incidence optics. Focusing properties are tested at the beam line 20XU of SPring-8. The focused beam size measured by knife-edge scan method is 170 nm x 190 nm at 10 keV. Preliminary experiments on scanning x-ray microscopy are also carried out, and a fine structure of 100 nm-line/100 nm-space is resolved in the measured image.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| Hard X-ray Nanoprobe with Spherical-aberration-corrected Quad-spherical-mirror Optics | 574KB |
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