Plasmon excitations in photo- and electron impact ionization of fullerenes

International Conference on Dynamics of Systems on the Nanoscale 2012

Verkhovtsev, A.V.^1,2 ; Korol, A.V.^1,3 ; Solov'yov, A.V.^1,4

Frankfurt Institute for Advanced Studies, Ruth-Moufang-Str. 1, 60438 Frankfurt am Main, Germany^1

St. Petersburg State Polytechnic University, Politekhnicheskaya ul. 29, 195251 St. Petersburg, Russia^2

Department of Physics, St. Petersburg State Maritime Technical University, Leninskii prospekt 101, 198262 St. Petersburg, Russia^3

A.F. Ioffe Physical-Technical Institute, St. Petersburg, Russia^4

关键词: Collective excitations;    Dominant contributions;    Electron energy loss spectrum;    Electron excitations;    Electron impact-ionization;    Ionization process;    Photoionization cross section;    Plasmon excitations;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/438/1/012011/pdf
DOI  :  10.1088/1742-6596/438/1/012011

来源: IOP

【 摘 要 】

We study collective electron excitations (also referred to as plasmons) in the C60fullerene in the processes of photoionization and electron inelastic scattering. To reveal the contribution of collective electron excitations, we utilize the plasmon resonance approximation. It is shown that within this framework the photoionization cross section is described as a sum of two contributions, which represent two coupled modes of the surface plasmon. The electron energy loss spectra of C60are described by three contributions, namely by the two modes of the surface plasmon and the volume plasmon. The results of calculations are in good agreement with experimental data on photoionization and electron inelastic scattering of C60. We show that the collective excitations play a significant role in the ionization process and provide a dominant contribution to the spectra.