Lateral Size of Graphene Characterized by Atomic Force Microscope

2018 4th International Conference on Environmental Science and Material Application

生态环境科学;材料科学

Liu, Zheng^1^2 ; Liu, Wenjun^1^2 ; Xie, Xue^1^2 ; Zhao, Weifang^1^2 ; Wen, Yu^1^2 ; Wang, Qinsheng^1^2 ; Ou, Bingxian^1^2

Wuxi Branch of Jiangsu Province Special Equipment Safety Supervision and Inspection Institute, Yanxin road 330, Huishan, Wuxi, China^1

National Graphene Products Quality Supervision and Inspection Center (Jiangsu), Yanxin road 330, Huishan, Wuxi, China^2

关键词: Chromatic aberration;    Composites material;    Graphene sheets;    Image processing;    methods;    Lateral sizes;    Topological structure;    Two Dimensional (2 D);   

Others  :  https://iopscience.iop.org/article/10.1088/1755-1315/252/2/022022/pdf
DOI  :  10.1088/1755-1315/252/2/022022

来源: IOP

【 摘 要 】

Graphene is a two-dimensional (2D) material possesses unique electronic, magnetic, optical, and mechanical properties that promise to many applications. It has been mass produced and successfully used as composites materials in the form of powder and dispersion. The lateral size and its distribution of graphene sheets are very important to the performance of composites materials. Atomic force microscopy (AFM), scanning electron microscopy (SEM) and optical microscope are normally used to explore the morphology and topological structure of graphene, and further to calculate the lateral size using image processing methods based on the pixels and chromatic aberrations. In this work, lateral size of graphene sheet was calculated based on the topographic height imaging, which is much accurate and convenient and can be used to other 2D materials.