Study Effect of Annealing on Optical Constants of (As0.5Se0.5 doped with Te at 1%) Thin Films

2nd International Scientific Conference (Pure Sciences, Brilliant Creativity and Renewed Building)

Al-Wardy, Rusul Adnan^1

Department of Physics, College of Science, Al-Mustansiriyah University, Baghdad, Iraq^1

关键词: Annealing temperatures;    Chalcogenide glass;    Effect of annealing;    Extinction coefficients;    Localized state;    Thermal-vacuum evaporation;    Transmission spectrums;    X-ray diffraction techniques;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/571/1/012106/pdf
DOI  :  10.1088/1757-899X/571/1/012106

来源: IOP

【 摘 要 】

In this work, thin films of (As0.5Se0.5 doped with Te at 1%) were prepared by thermal vacuum evaporation on glass bases in (R.T) with (100±20)nm thickness deposition rate (1.6nm/s) and study effects of annealing temperature (Ta) (348,398,448)K for time (30min) on optical constants for prepared films. The X-ray diffraction technique showed that all prepared films are amorphous in structure at room temperature and annealing films at (348, 398,448)K. The optical constants (refractive index (n 0), extinction coefficient (K 0), dielectric constant (∈r)) evaluated from transmission spectra in wavelength range (500-1100)nm and found that it increase with the increasing of (Ta) for the prepared films.