Bayesian Reliability Analysis of Exponential Distribution Model Based on Zero-failure Data and Scale Squared Error Loss Function

2019 International Conference on Advanced Electronic Materials, Computers and Materials Engineering

无线电电子学;计算机科学;材料科学

Ying, Song^1 ; Yuanping, Cao^1

School of Business, Wuzhou University, Wuzhou, Guangxi

543002, China^1

关键词: Bayes estimation;    Bayesian reliabilities;    Exponential distributions;    Exponential models;    Gamma distribution;    Prior distribution;    Squared error loss functions;    Zero failure data;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/563/5/052053/pdf
DOI  :  10.1088/1757-899X/563/5/052053

来源: IOP

【 摘 要 】

Based on the zero failure data, this paper studies the Bayes estimation of the failure rate and reliability of the exponential distribution model under the scale squared error loss function. When the prior distribution of the parameters is the Gamma distribution, the Bayes estimators and E-Bayes estimators of the failure rate and reliability of the exponential model can be obtained. Finally, a practical example is utilized to illustrate the effectiveness of the estimation.