The Residual Stress Distribution of Ti-6Al-4V Thin Wall in the Selective Laser Melting

4th International Conference on Manufacturing, Material and Metallurgical Engineering

Chen, Changpeng^1 ; Zhu, Haihong^1 ; Xiao, Zhongxu^1 ; Liu, Shiwen^1 ; Yin, Jie^1 ; Zeng, Xiaoyan^1

Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei

430074, China^1

关键词: 3-D FE models;    Coupled thermal-structural;    High temperature gradient;    Layer by layer;    Process parameter optimization;    Secondary stress;    Stress variations;    Ti-6 Al-4 V;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/538/1/012020/pdf
DOI  :  10.1088/1757-899X/538/1/012020

来源: IOP

【 摘 要 】

High residual stress caused by the high temperature gradient brings undesired effects such as shrinkage and cracking in the SLM process. This study developed a layer-by-layer 3D FE model based on sequentially coupled thermal-structural method to predict the residual stress distribution and the stress variations of Ti-6Al-4V thin wall. The X-component of stress has the greatest impact on the residual stress distribution of the thin wall, followed by the Z-component of stress, and the smallest is the Y-component of stress. The maximum residual stress is observed at the corner of the interface between the part and substrate, the secondary stress is near the top center region of the part. The findings of this study will provide a better understanding of residual stress distribution in the SLM and constructive guidance for process parameter optimization.