Cryogen-free apparatus for rapid thermal emissivity measurements at low temperature

27th International Cryogenics Engineering Conference and International Cryogenic Materials Conference 2018

Shen, F.Z.^1^2 ; Xu, D.^1^2 ; Li, X.^1^2 ; Liu, H.M.^1 ; Li, L.F.^1^2

Key Laboratory of Cryogenics, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing

100190, China^1

University of Chinese Academy of Sciences, Beijing

100049, China^2

关键词: Cryogenic temperatures;    Low temperatures;    Material surface;    Measurement device;    Radiation properties;    Radiative properties;    Thermal emissivity;    Vacuum environment;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/502/1/012190/pdf
DOI  :  10.1088/1757-899X/502/1/012190

来源: IOP

【 摘 要 】

Thermal radiation is a significant way of heat transfer among insulation parts. For minimization of heat leakage, the radiative properties of materials are essential for the design of cryogenic devices. Emissivity is a key element of radiation properties of materials. However, such experimental data are always not sufficient, especially at cryogenic temperature. In order to measure the radiative properties of material surfaces, a measurement device was presented. The device is based on a two-stage Gifford-McMahon refrigerator and the dismountable sample test rod has independent vacuum environment, which allows the sample to be replaced rapidly. In emissivity measurement, the temperature of examined samples can be controlled precisely between 15.4 K to room temperature.