Factographic information retrieval for semiconductor physics, micro - and nanosystems

2nd International Telecommunication Conference "Advanced Micro- and Nanoelectronic Systems and Technologies"

Kulik, S.D.^1

National Research Nuclear University MEPhI, Moscow Engineering Physics Institute, Kashirskoe shosse 31, Moscow

115409, Russia^1

关键词: Average length;    Document descriptions;    Effectiveness indicators;    Pattern recognition algorithms;    Semiconductor physics;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/498/1/012026/pdf
DOI  :  10.1088/1757-899X/498/1/012026

来源: IOP

【 摘 要 】

This paper proposes a factographic information retrieval for semiconductor physics, as well as micro - and nanosystems. This factographic information retrieval includes a pattern recognition algorithm and factographic database. The first factographic database includes special keywords from semiconductor physics and micro - and nanosystems. The second factographic database includes document descriptions in the form of Searching Documents Patterns for the fields of semiconductor physics and microelectronics. An analytical model of the factographic information retrieval system is developed. This model is presented by an effectiveness indicator: the average length of the recommendatory list used for semiconductor physics and micro - and nanosystems for space application.