Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

Victor Bellitto

keywords: Electrochemistry;   

Publisher: INTECH

Subject:

【 摘 要 】

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.

【 授权许可】

CC BY   

【 图 表 】

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