开放图书详细信息
| Scanning Probe Microscopy-Physical Property Characterization at Nanoscale | ||
| Vijay Nalladega | ||
| keywords: Electrochemistry; | ||
| Publisher: INTECH | ||
| Subject: | ||
【 摘 要 】
Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.【 授权许可】
CC BY
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| Characterization of Complex Spintronic and Superconducting Structures by Atomic Force Microscopy Techniques.pdf | 1443KB |  download |
|
| Elastic and Nanowearing Properties of SiO2-PMMA and Hybrid Coatings Evaluated by Atomic Force Acoustic Microscopy and Nanoindentation_.pdf | 1266KB | download |
|
| Estimation of Grain Boundary Sliding During Ambient-Temperature Creep in Hexagonal Close-Packed Metals Using Atomic Force Microscope.pdf | 535KB | download |
|
| Influence of Thickness on Structural and Optical Properties of Titanium Oxide Thin Layers.pdf | 463KB | download |
|
| Microtribological Behavior of Polymer-Nanoparticle Thin Film with AFM.pdf | 2504KB | download |
|
| Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy.pdf | 955KB | download |
|
| Nanomechanical Evaluation of Ultrathin Lubricant Films on Magnetic Disks by Atomic Force Microscopy.pdf | 1381KB | download |
|
| Polyamide-Imide Membranes of Various Morphology - Features of Nano-Scale Elements of Structure.pdf | 1984KB | download |
|
| Scanning Probe Microscopy-Physical Property Characterization at Nanoscale.jpg | 101KB | Image | download |
| Statistical Analysis in Homopolymeric Surfaces.pdf | 2399KB | download |
|
| Tuning Fork Scanning Probe Microscopes - Applications for the Nano-Analysis of the Material Surface and Local Physico-Mechanical Properties.pdf | 1898KB | download |
【 图 表 】
Scanning Probe Microscopy-Physical Property Characterization at Nanoscale.jpg
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