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1 2 X-ray generation, emission, detection and measurement; wavelength dispersive spectrometer (WDS); analyzing crystals and proportional counters; WDS signal processing with single channel analyzer; compositional imaging (X-ray mapping) using WDS [开放课件]

授课人:Dr. Nilanjan Chatterjee

课程:Electron Microprobe Analysis,

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2 3 Quantitative analysis using WDS; sample preparation; carbon coating; peak and background in WD spectra; detector settings through pulse height analysis; peak overlap corrections. [开放课件]

授课人:Dr. Nilanjan Chatterjee

课程:Electron Microprobe Analysis,

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使用许可:CC BY-NC-SA

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3 1 Introduction; electron-specimen interactions; electron detectors; scanning electron imaging (backscattered and secondary electron, BSE and SE); cathodoluminescence (CL) imaging; qualitative analysis using BSE imaging and energy dispersive spectrometry (EDS). [开放课件]

授课人:Dr. Nilanjan Chatterjee

课程:Electron Microprobe Analysis,

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使用许可:CC BY-NC-SA

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4 4 Matrix (ZAF) corrections in quantitative analysis; ?(?z) corrections [开放课件]

授课人:Dr. Nilanjan Chatterjee

课程:Electron Microprobe Analysis,

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使用许可:CC BY-NC-SA

预览  |  原文链接  |  全文  [ 浏览：5 下载：7  ]