科研项目详细信息
New Insight into Tip-Sample Interaction by Scanning Probe Methods
Meyer Ernst
University of Basel - BS
keywords:SPM; STM; SFM; Atomic and molecular resolution; true atomic resolution by AFM in ultrahigh vacuum; insulators; force microscopy; kelvin force microscopy; non-contact force microscopy; scanning tunneling microscopy; atomic friction
keywords:
Subject:物理(综合)
瑞士|英语
2009至2009
Source: 瑞士国家科学基金会
Link: http://p3.snf.ch/Pages/DataAndDocumentation.aspx