科研项目详细信息
New Insight into Tip-Sample Interaction by Scanning Probe Methods | |
Meyer Ernst | |
University of Basel - BS | |
keywords:SPM; STM; SFM; Atomic and molecular resolution; true atomic resolution by AFM in ultrahigh vacuum; insulators; force microscopy; kelvin force microscopy; non-contact force microscopy; scanning tunneling microscopy; atomic friction | |
keywords: | |
Subject:物理(综合) | |
瑞士|英语 | |
2009至2009 | |
Source: 瑞士国家科学基金会 | |
Link: http://p3.snf.ch/Pages/DataAndDocumentation.aspx |