学位论文

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1 Enabling low cost test and tuning of difficult-to-measure device specifications: application to DC-DC converters and high speed devices [学位论文]

作者:Wang, Xian, Chatterjee, Abhijit Electrical and Computer Engineering Raychowdhury, Arijit Keezer, David Mukhopadhyay, Saibal Singh, Adit D., Chatterjee, Abhijit

论文开放时间:2015

关键词:Signature test;RF signal generation;...

培养单位:University:Georgia Institute of Technology

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2 Built-in test for performance characterization and calibration of phase-locked loops [学位论文]

作者:Hsiao, Sen-Wen, Chatterjee, Abhijit Electrical and Computer Engineering Chang, Gee-Kung Swaminathan, Madhavan Cressler, John Kohl, Paul, Chatterjee, Abhijit

论文开放时间:2014

关键词:Phase-locked loop;Built-in test;...

培养单位:University:Georgia Institute of Technology

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