1 Stress testing on silicon carbide electronic devices for prognostics and health management. [科技报告]
作者:Kaplar, Robert James;Brock, Reinhard C.;Marinella, Matthew;等
发布日期:2011
关键词:ELECTRONIC EQUIPMENT;MECHANICAL TESTS;...
发布机构:
作者:Schofield, Daryl (NASCENTechnology, Inc., Watertown, SD);Schare, Joshua M., Ph.D.;Slama, George (NASCENTechnology, Inc., Watertown, SD);等
发布日期:2009
关键词:DESIGN;FERRITE;...
发布机构:
作者:Johnson, William Arthur;Warne, Larry Kevin;Merewether, Kimball O.;等
发布日期:2007
关键词:BOLTED JOINTS;LIGHTNING;...
发布机构:
作者:Simons, Rainee N, Wintucky, Edwin G, Waldstein, Seth W
发布日期:2019
关键词:CONTINUOUS RADIATION;COMMUNICATION NETWORKS;...
发布机构: