1 Stress testing on silicon carbide electronic devices for prognostics and health management. [科技报告]
作者:Kaplar, Robert James;Brock, Reinhard C.;Marinella, Matthew;等
发布日期:2011
关键词:ELECTRONIC EQUIPMENT;MECHANICAL TESTS;...
发布机构:
作者:Barnard, Casey Anderson
发布日期:2010
关键词:OPTICAL EQUIPMENT;THERMAL STRESSES;...
发布机构:
作者:Daugherty, W.
发布日期:2016
关键词:GASKETS;LEAKS;...
发布机构:
作者:BD Middleton, J Buongiorno
发布日期:2007
关键词:BRAYTON CYCLE;C REACTOR;...
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