• 已选条件：
  • × International Journal of Technolog
  • × Comparative analysis
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1 A Comprehensive Solution to Automated Inspection Device Selection Problems using ELECTRE Methods [期刊论文]

来源：International Journal of Technology , 2014

作者:PrasenjitChatterjee

关键词:Automated inspection device selection;Comparative analysis;...

使用许可:CC BY-NC-ND

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2 A Comprehensive Solution to Automated Inspection Device Selection Problems using ELECTRE Methods [期刊论文]

来源：International Journal of Technology , 2014

作者:PrasenjitChatterjee

关键词:Automated inspection device selection;Comparative analysis;...

使用许可:CC BY-NC-ND

预览  |  原文链接  |  全文  [ 浏览：7 下载：3  ]