• 已选条件:
  • × 4th International Conference on Advanced Science
  • × Materials Science and Nanotechnology Dept., Faculty of Post Graduate Studies for Advanced Sciences, Beni-Suef University, Beni-Suef, Egypt^2
  • × Field emission scanning electron microscopes
 全选  【符合条件的数据共:1条】

作者:Kamar, E.M.^1, El-Dek, S.I.^2

关键词:FESEM;Field emission scanning electron microscopes;...

会议举办机构:Chemistry Department, Faculty of Science, Benha University, Benha, Egypt^1

会议时间:2018

预览  |  原文链接  |  全文  [ 浏览:13 下载:2  ]