• 已选条件:
  • × International Conference on Innovations in Non-Destructive Testing (SibTest
  • × Small-sized device
 全选  【符合条件的数据共:1条】

作者:Shashev, D.V.^1, Shidlovskiy, S.V.^1,2

关键词:Computing architecture;Digital imaging system;...

会议举办机构:Department of Innovative Technologies, National Research Tomsk State University, 36 Lenin ave., Tomsk

会议时间:2017

预览  |  原文链接  |  全文  [ 浏览:7 下载:1  ]