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  • × 2017 3rd International Conference on Applied Materials and Manufacturing Technolog
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1 Diagnostics Method for Analog Circuits Based on Improved KECA and Minimum Variance ELM [会议论文]

作者:Yuan, Zhijie^1, He, Yigang^1, Yuan, Lifen^1

关键词:Component analysis;Data transformation;...

会议举办机构:School of Electrical Engineering and Automation, Hefei University of Technology, Hefei

会议时间:2017

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