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  • × 116024, China^1
  • × Scanning techniques
 全选  【符合条件的数据共:1条】

作者:Wu, C.W.^1, Zhu, Z.D.^1, Zhang, W.^1

关键词:Brain protection;Computed topography;...

会议举办机构:State Key Lab of Structural Analysis for Industrial Equipment, Department of Engineering Mechanics, Dalian University of Technology, Dalian

会议时间:2015

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