Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies

FPGA based testing;Test enhancement;High-speed digital test;Automated test equipment;Test module;Multi-GHz testing

Majid, Ashraf Muhammad ; Electrical and Computer Engineering

University:Georgia Institute of Technology

Department:Electrical and Computer Engineering

关键词: FPGA based testing;    Test enhancement;    High-speed digital test;    Automated test equipment;    Test module;    Multi-GHz testing;   

Others  :  https://smartech.gatech.edu/bitstream/1853/39562/1/majid_ashraf_m_201105_phd.pdf

美国|英语

来源: SMARTech Repository

【 摘 要 】

Methods for Extending High-Performance Automated Test Equipment (ATE) usingMulti-Gigahertz FPGA TechnologiesAshraf M. Majid264 PagesDirected by Dr. David KeezerThis thesis presents methods for developing multi-function, multi-GHz, FPGAbasedtest modules designed to enhance the performance capabilities of automated testequipment (ATE). The methods are used to develop a design approach that utilizes a testmodule structure in two blocks. A core logic block is designed using a multi-GHz FPGAthat provides control functions. Another block called the âapplication specificâ logicblock includes components required for specific test functions. Six test functions aredemonstrated in this research: high-speed signal multiplexing, loopback testing, jitterinjection, amplitude adjustment, and timing adjustment. Furthermore, the test module isdesigned to be compatible with existing ATE infrastructure, thus retaining full ATEcapabilities for standard tests. Experimental results produced by this research provideevidence that the methods are sufficiently capable of enhancing the multi-GHz testingcapabilities of ATE and are extendable into future ATE development. The modularapproach employed by the methods in this thesis allow for flexibility and futureupgradability to even higher frequencies. Therefore the contributions made in this thesishave the potential to be used into the foreseeable future for enhancements tosemiconductor test capabilities.