Opto-electronic Technique For Error Fault Detection In Textile Joining Applications

optical skipped stitch detector

Foster, Howard Allen Jr. ; Michael A. Paesler, Committee Member,Christopher R. Gould, Committee Member,Dr. Hans Hallen, Committee Chair,Foster, Howard Allen Jr. ; Michael A. Paesler ; Committee Member ; Christopher R. Gould ; Committee Member ; Dr. Hans Hallen ; Committee Chair

University:North Carolina State University

关键词: optical skipped stitch detector;   

Others  :  https://repository.lib.ncsu.edu/bitstream/handle/1840.16/299/etd.pdf?sequence=1&isAllowed=y

美国|英语

来源: null

【 摘 要 】

The purpose of this research has been to develop an opto-electronic method for detecting error faults in textile joining applications.The application of this study would be in on-line determination of skipped stitches in seam sewing operations.The research begins with a selection of materials that covers a range of textile materials commonly used, and then determining several physical parameters based upon industry standards.The next portion of the research is to determine the proper wavelength of light to use for the opto-electronics, using near infrared and visible spectrophotometric techniques for acceptable light reflection levels for qualitative analysis.This study then focuses on using NIR wavelength light at 1550nm, using an InGaAsP laser diode module with optics and corresponding Germanium photodiode detector with a wavelength-matched interference filter, to monitor a stitch line passed by the test apparatus to determine the presence of skipped stitches, or stitches where the top thread and looper thread do not properly catch and hold in the sewing of a seam.Due to the spot size of the manufactured laser diode module, a ½" basting stitch, commonly used to temporarily attach fabric pieces, is selected as the best stitch type to use to verify the hypothesis.After determining the ideal positions of the laser diode and photodiode assemblies using geometric optics arguments and extensive position-related intensity measurements, the assembly is mounted onto a linear slide table, and fabric samples, sewn with the ½" basting stitch to simulate a seam, are aligned and tested for variations in light levels based on the presence of a stitch or a space.It is then shown that this method for detecting skipped stitches is a viable alternative to the current visual inspection performed by factory employees.