学位论文详细信息
High-speed characterizations of single quantum-well transistor laser | |
Transistor Laser;Bit Error Ration Testing | |
Wang, Curtis Yilin ; Feng ; Milton | |
关键词: Transistor Laser; Bit Error Ration Testing; | |
Others : https://www.ideals.illinois.edu/bitstream/handle/2142/89158/WANG-THESIS-2015.pdf?sequence=1&isAllowed=y | |
美国|英语 | |
来源: The Illinois Digital Environment for Access to Learning and Scholarship | |
【 摘 要 】
The transistor laser (TL) is a unique three-terminal semiconductor laser device that possesses qualities and functionalities that cannot be achieved by diode lasers alone. In this thesis, the history of development and device structure, as well as the carrier dynamics in the TL will be first presented to provide background discussion. The focus of this thesis will be on the methods of high-speed characterizations on TLs and data of the optical modulation bandwidth, f-3dB, and error-free data transmission.
【 预 览 】
Files | Size | Format | View |
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High-speed characterizations of single quantum-well transistor laser | 1746KB | download |