Reliable spin-based computing systems

error resiliency;spintronics;Beyond-CMOS, ,

Patil, Ameya D ; Shanbhag ; Naresh R.

关键词: error resiliency;    spintronics;    Beyond-CMOS, ,;   

Others  :  https://www.ideals.illinois.edu/bitstream/handle/2142/92663/PATIL-THESIS-2016.pdf?sequence=1&isAllowed=y

美国|英语

来源: The Illinois Digital Environment for Access to Learning and Scholarship

【 摘 要 】

Scaling of logic devices has enabled tremendous improvement in computational efficiency. However, computational scaling beyond the electronics based on Moore's law requires the adoption of alternate state variables including spin. Spin based devices offer several advantages such as low device count and non-volatility, and have the potential to beat the energy-delay product of CMOS. However, thermal noise in these devices makes their switching delay a random variable. Deterministic von Neumann style computing requires them to operate at worst case delay (and low error-rate), thereby completely offsetting the energy-delay benefits of spin devices and making them non-competitive against CMOS. In this thesis, we show that, by exploiting inherent device characteristics and architectural-level techniques, it is possible to shape the system-level output error distribution, thereby enabling effective error compensation and reliable system behavior. In particular, we demonstrate that, for a simple binary classifier, 33× improvement in accuracy over conventional design can be achieved while tolerating device error rate of 10%. This work paves a way towards the design of reliable spin-based systems using highly error prone, but energy-efficient spin devices.