Automatic test data generation for control flow coverage using Boolean constraints

Automated test data generation;University of Wisconsin - Platteville: Master of Science - Computer Science;Modeling;Control flow coverage;UW Platteville - Master of Science - Computer Science

Weiler, Stefan C.del Pino, Alexander (Advisor) ;

University of Wisconsin

关键词: Automated test data generation;    University of Wisconsin - Platteville: Master of Science - Computer Science;    Modeling;    Control flow coverage;    UW Platteville - Master of Science - Computer Science;   

Others  :  https://minds.wisconsin.edu/bitstream/handle/1793/68673/WeilerStefan.pdf?sequence=5&isAllowed=y

瑞士|英语

来源: University of Wisconsin