Noise Characterization of a CMOS X-Ray Image Sensor

A-Se;CMOS Imager

Liang, YiJieadvisor:Peter, Levine ; advisor:Karim, Karim ; affiliation1:Faculty of Engineering ; Karim, Karim ; Peter, Levine ;

University of Waterloo

关键词: A-Se;    CMOS Imager;    Master Thesis;   

Others  :  https://uwspace.uwaterloo.ca/bitstream/10012/13748/3/Liang_YiJie.pdf

瑞士|英语

来源: UWSPACE Waterloo Institutional Repository

【 摘 要 】

The objective of this thesis is to validate the noise performance of a high resolution CMOS X-ray imager. We carry out a detailed noise analysis on a four-quadrant CMOS imager and the external hardware. Careful analysis reveals several design issues on theprinted circuit board (PCB). We propose solutions to improve the PCB design. Experimental results show the modified system outperforms the original one with a sizable margin