Stress Induced Degradation Modes in CIGSS Minimodules (Presentation).

Kempe, M. D. ; Terwilliger, F. ; Tarrant, D.

Technical Information Center Oak Ridge Tennessee

关键词: Photovoltaic cells;    Degradation;    Copper;    Indium;    Stresses;   

RP-ID  :  DE2008939517

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

The experimental objectives of this report are: (1) compare the performance of modules exposed to high temperature and humidity; (2) determine the effects of different encapsulants on long term stability of CIGSS modules; and (3) analyze failure modes to determine areas in need of improvement.