Warm, Dense Plasma Characterization by X-ray Thomson Scattering.

Landen, O. L. ; Glenzer, S. H. ; Cauble, R. C. ; Lee, R. W. ; Edwards, E.

Technical Information Center Oak Ridge Tennessee

关键词: X-rays;    Dense plasmas;    Ionization state;    Density;    Material properties;   

RP-ID  :  DE200515013191

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

We describe how the powerful technique of spectrally resolved Thomson scattering can be extended to the x-ray regime, for direct measurements of the ionization state, density, temperature, and the microscopic behavior of dense cool plasmas. Such a direct measurement of microscopic parameters of solid density plasmas could eventually be used to properly interpret laboratory measurements of material properties such as thermal and electrical conductivity, EUS and opacity. In addition, x-ray Thomson scattering will provide new information on the characteristics of rarely and hitherto difficult to diagnose Fermi degenerate and strongly coupled plasmas.