Test Protocol to Screen Capacitors for Radiation-Induced Charge Loss.

Zarick, T. A. ; Hartman, E. F.

Technical Information Center Oak Ridge Tennessee

关键词: Capacitors;    Ionizing radiations;    Dielectric materials;    Screens;    Test methods;   

RP-ID  :  DE2008940528

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

This report presents a test protocol for screening capacitors dielectrics for charge loss due to ionizing radiation. The test protocol minimizes experimental error and provides a test method that allows comparisons of different dielectric types if exposed to the same environment and if the same experimental technique is used. The test acceptance or screening method is fully described in this report. A discussion of technical issues and possible errors and uncertainties is included in this report also.