Novel Integrating Solid State Detector with Segmentation for Scanning Transmission Soft X-Ray Microscopy.

Feser, M. ; Jacobsen, C. ; Rehak, P. ; De Geronimo, G. ; Holl, P. ; Struder, L.

Technical Information Center Oak Ridge Tennessee

关键词: Radiation detectors;    X-Ray equipment;    Microscopes;    X-Ray detection;    Design;   

RP-ID  :  DE200415006568

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

An integrating solid state detector with segmentation has been developed that addresses the needs in scanning transmission x-ray microscopy below 1 keV photon energy. The detector is not cooled and can be operated without an entrance window which leads to a total photon detection efficiency close to 100%. The chosen segmentation with 8 independent segments is matched to the geometry of the STXM to maximize image mode flexibility. In the bright field configuration for 1 ms integration time and 520 eV x-rays the rms noise is 8 photons per integration.