科技报告详细信息
| PEEM Thermal Stress and Reliability. Project Duration FY08 to FY 10. | |
| O'Keefe, M. P. ; Bnnion, K. ; Kelly, K. ; Narumanchi, S. | |
| Technical Information Center Oak Ridge Tennessee | |
| 关键词: Electron microscopy; Electronic equipment; Thermal stresses; Reliability; High power; | |
| RP-ID : DE2007921202 | |
| 学科分类：工程和技术（综合） | |
| 美国|英语 | |
| 来源: National Technical Reports Library | |
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【 摘 要 】
Advancing power electronics thermal stress and reliability is a critical factor in power electronics equipment. NREL aims to improve thermal stress and reliability of power electronics technologies.
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| DE2007921202.pdf | 635KB |  download |
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