科技报告详细信息
Crystal Growth and Wafer Processing for High Yield and High Efficiency Solar Cells. Final Technical Report, 1 October 2003-15 January 2008. | |
Rozgonyi, G. A. ; Youssef, K. | |
Technical Information Center Oak Ridge Tennessee | |
关键词: Solar energy; Materials science; Crystal growth; Defects; Dislocations; | |
RP-ID : DE2008942087 | |
学科分类:工程和技术(综合) | |
美国|英语 | |
来源: National Technical Reports Library | |
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【 摘 要 】
Hardness, elastic modulus, and fracture toughness of low and high carrier-lietime regions in polycrystalline silicon were evaluated using the nanoindentation technique.
【 预 览 】
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DE2008942087.pdf | 618KB | ![]() |